NEBS Conference 2002
NEBS 2001 - Securing the Network
Conference Day 1 - Tuesday, October 8, 2002 7:00-8:00 Registration & Continental Breakfast 8:00-8:20 Welcome/IntroductionChuck Graff
Director Verizon Laboratories Conference Chairman 8:20-8:40 Keynote SpeakerJim Sylvester - Verizon Laboratories VP-Systems Integration & Testing 8:40-9:20 GR-63 Environmental Criteria (Section 4.0)Bob Backstrom - Engineering Group Leader, Underwriters Laboratories 9:20-10:00 GR-63 Practical Applications & Fire Test Methods (Section 5.2)Chuck Graff - Director, Verizon Laboratories 10:00-10:20 BREAK (Exhibits Open) 10:20-11:25 GR-63 Thermal / Altitude Criteria (Section 4.1) GR-3028 HighlightsRich Kluge - Director NEBS Technical Services Group, Telcordia Technologies 11:25-12:00 GR-63 Earthquake Criteria / Seismic Resistance (Section 4.4)Rich Gemra - Member Technical Staff, Lucent Technologies 12:00-1:00 LUNCH & EXHIBITS 1:00-1:40 Effects of Contamination on Electronics - Examples from WTC disaster on Verizon Central OfficeChao-Ming Liu - Director, Disaster Management Services, Telcordia Technologies 1:40-2:20 GR-63 Airborne Contaminants (Section 5.5)Francois Sandroff - Executive Director Network Reliability, Operations and Deployment, Telcordia Technologies 2:20-3:00 Verizon ITL Programs & NEBS Checklist UpdatesChuck Graff - Director Verizon Laboratories, Conference Chairman 3:00-3:20 BREAK & EXHIBITS 3:20-4:00 Q/A with Industry Experts (Day One Speakers) 4:00-5:00 RECEPTION & EXHIBITS - Networking with conference participants and exhibitors
Conference Day 2 - Wednesday - October 9, 2002
7:30-8:00 Continental Breakfast 8:00-8:20 Keynote SpeakerDennis Jennings - Vice President Systems Testing & Integration, Telcordia Technologies 8:20-9:00 Verizon's Restoration of Wall Street's Network after 9/11Michael Daigle - Vice President, Verizon Network Planning 9:00-10:30 The Vendor's Corner Earthquake Testing Video DemonstrationJohn Krahner - Manager, Cisco Systems Maintaining Your NEBS Certification - A Vendor's Viewpoint on ChangeDave Lorusso - Consultant, Lorusso Technologies, LLC Network Reliability & NEBS: Designing "Carrier Class" Telecom ProductsMarko Radojicic - Manager, Hardware Design Assurance, Maple Optical Systems 10:30-10:50 BREAK & EXHIBITS 10:50-11:15 Understanding AT&T's NEBS RequirementsDean Garrett - Director - AT&T NEBS Compliance 11:15-12:00 GR-1089 ESD / EMI Criteria and Test Methods (Sections 2-3)John Lichtig - President, Lichtig EMC Consulting, LLC 10:30-10:50 LUNCH & EXHIBITS 1:00-1:30 Navigating Through EMC Testing (Video)James Press - EMC Director, National Technical Systems 1:30-2:30 GR-1089 / Lightning and AC Power Fault, Steady-State Power Induction, DC Potential Difference, Electrical Safety Criteria, Corrosion, Bonding and Grounding (Sections 4-9)Bob Martin - Sr. Technical Manager, Intertek ETL SEMKO 2:30-2:50 BREAK & EXHIBITS 2:50-3:30 GR-1089 / Electromagnetic Compatibility & Electrical Safety (New Revisions)Rich Kluge - Director NEBS Technical Services Group, Telcordia Technologies 3:30-4:30 Q/A with Industry Experts (Day Two Speakers)
7:30-8:00 Continental Breakfast 8:00-9:30 The Laboratory Corner Evaluating Product Changes to Ensure Continued ComplianceTroy Franklin - Vice President Operations, MET Labs Designing for NEBS Compliance - The New Engagement ModelAndrea Szabo - Senior Design Engineer, Solectron Low Frequency Correlation of Radiated Emission Measurements Between an Anechoic Chamber and an OATSCliff Jones - Chief Engineer Telecom Stream, Intertek ETL SEMKO 9:30-10:00 Verizon Central Office Virtual TourHoward Davis - Distinguished Member Technical Staff, Verizon 10:00-10:30 BREAK & EXHIBITS 10:30-11:10 Telcordia GR-1089 Relationships to Other US & International StandardsJon Curtis - Director Engineering, Curtis-Straus Labs 11:10-11:50 GR-78 Physical Design & Manufacture of Telecommunications ProductsMark A. Ali - Manager, Systems Technology and Reliability Effectiveness, Telcordia Technologiess 11:50-12:00 Closing RemarksChuck Graff - Director Verizon Laboratories, Conference Chairman






